COMPLEX: A Closed-Form Certified Embedding of Multiparameter Persistence Modules

Sushovan Majhi, Atish Mitra, Žiga Virk, Pramita Bagchi

Every multiparameter persistence vectorization we know of carries a one-sided Lipschitz upper bound and nothing below it: without a lower gauge there is no sense in which the features are faithful, and no per-prediction guarantee can be built on them. This paper supplies the missing side. COMPLEX is a closed-form, training-free embedding of multiparameter modules -- slice the module along a fixed near-diagonal net, embed each slice barcode by the certified PLACE/PALACE landmark map, concatenate. Under a checkable witnessing-slice coherence condition, holding on 100% of audited pairs on Orbit5k, a single slice carries a closed-form lower gauge: separated modules stay separated in the embedding. With the standard upper bound this gives, to our knowledge, the first two-sided distortion bound for a multiparameter feature map, making faithfulness measurable. Measuring it, we find the floor tight within a small factor of realized distances yet operationally local: an RBF-SVM reaches 91% where 1-NN reaches 78% on the same features. Local per-prediction certification therefore fails for a structural reason common to every landmark embedding whose lower gauge is witnessed by one…