CARVE: Breaking Data Barriers in Chip Placement by Harnessing Reusable Expertise

Jiefu Zhang, Haixiang Sun, Yang Xu, Vaneet Aggarwal, Zishen Wan

Pretrained macro-placement policies can reduce repeated optimization across circuits, but deployment often exposes them to unfamiliar designs when the original training data are unavailable. Repeatedly fine-tuning a single serving model can overwrite earlier improvements, while simply saving checkpoints does not determine where they can be reliably reused. We introduce Continual Adaptation through the Reuse of Validated Expertise (CARVE), a framework that represents accumulated expertise as a frozen base policy, immutable specialists, and task-specific credentials obtained through local validation. For a new task, CARVE first checks existing specialists and trains a new specialist from the frozen base only when none qualifies. Under fixed task distributions and validation rules that control cumulative error, we establish expected-performance guarantees for repeated reuse. For bounded losses, we also derive matching worst-case bounds on the local samples needed for reliable reuse. In macro placement, a reuse-first follow-up reduces recorded training time by 58.5% (9.66 to 4.01 hours), while mean HPWL gain changes only from 8.41% to 7.86%. In a simulated receiving deployment,…