Improving Test-Time Scaling with Adaptive Looped Transformers

Yichen You, Tianyu Fu, Aosong Feng, Xingtai Lv, Xuefei Ning +2

Looped transformers have demonstrated promising parameter efficiency by reusing layers for latent computation. Prior studies compare looped and non-looped models at matched parameters or per-token FLOPs. However, to the best of our knowledge, whether looping improves test-time scaling as outputs grow longer remains underexplored. Through post-training looped transformers, we study the accuracy-compute slope, measured as the accuracy gain per doubling of test-time decoding FLOPs. We find that existing looped transformers often yield steeper slopes than their non-looped baseline, yet underperform it at matched compute. While fixed-depth looping spends extra iterations on every token, our analysis shows that many tokens do not benefit from extra iterations. We therefore propose TaH2, which enables the model to focus extra iterations on the tokens that benefit from looping. It jointly post-trains the backbone and an iteration decider through lookahead depth supervision, which uses online labels indicating whether further iteration improves the prediction. TaH2 improves both the efficiency and attainable accuracy of test-time scaling. On challenging AIME benchmarks, TaH2 improves the…