A Digital Simulation Toolkit for Physics-Based Generation of Realistic Experimental Scanning Tunneling Microscopy Images

Huanhuan Zhao, Laxmi Bhurtel, Connor Vernachio, Fahmy Paiziah, Wonhee Ko +1

Scanning Tunneling Microscopy (STM) is a widely used tool for characterizing surfaces of materials at the atomic scale, playing a crucial role in discoveries across condensed matter physics and materials science. Despite its extreme spatial resolution, STM is one of the most sensitive microscopy techniques and is highly prone to noise. While existing unsupervised denoising methods are very cheap to train, these are primarily focused on removing the noise with minimal recovery of key physical information. While supervised methods can offer superior performance, the major bottleneck is that a large amount of paired clean-noisy experimental images is required which are impractical to obtain. Thus, we developed a low-cost physics-driven digital toolkit to rapidly generate large volume of realistic STM images. Firstly, we simulate clean images from a chosen material system. Then, with prior knowledge of the physical characteristics of the artifacts and noise present in STM experiments, we formulate several artifact-noise functions such as Gaussian electronic noise, 1/f flicker noise, scan-line noise, background tilt and mechanical drift. These physically informed noise components are…