Targeted search shows that random-device testing underestimates worst-case error in a simulated wave-based neural operator

Samrendra Roy, Jason Yoo, Souvik Chakraborty, Syed Bahauddin Alam

Wave-based processors promise fast, energy-efficient Fourier layers for neural operators. They are usually validated on randomly sampled devices, but using them requires knowing how large their error can become under fabrication and alignment variation. In a stylised numerical case study, a hybrid Fourier neural operator runs its four spectral layers on simulated coherent 4f processors with 32 toleranced knobs, whose half-widths are representative rather than calibrated. For 120 models (four tasks, six training methods, five seeds), we compared the worst of N random in-spec devices with a searched one. On a deterministic simulator with one frozen draw of the random static errors, the searched device's held-out error was 1.08-3.10 times the maximum over 200 Monte Carlo devices and 1.06-2.71 times that over 1000. With 20 fresh static draws, it still exceeded the maximum over 200 random devices in 116 of 120 models. Under uniform sampling, the probability of drawing such a device is at most 0.37% per model (two-sided 95% Clopper-Pearson), which says nothing about how large its error is. The gap persisted with uniform or Sobol' sampling at the search's budget, shared knobs, a second…