Cross-Scenario Industrial Defect Detection via Domain-Robust Training and Metric-Aligned Selection

Dikai Li, Weijia Wang, Yuan-Gen Wang

Automated defect detection of industrial boards must remain highly reliable under cross-scenario variations in lighting, surface contaminants, and production line conditions. This makes cross-scenario defect detection a domain generalization problem, wherein models are required to detect, localize, and classify defects across unseen scenarios while minimizing false alarms on clean boards. For the IDA 2026 Track 1 challenge, we propose a cross-scenario defect detection method that includes four complementary modules: cross-scenario robust training, small-defect-aware learning, score calibration and inference threshold selection, and metric-aligned checkpoint selection. These four modules respectively introduce cross-scenario robust normalization and DSU-style statistic perturbation with progressive random convolution, NWD and parameter-free spatial attention, the VFL learning objective, and a custom SWAD variant driven by the Track 1-oriented proxy. Experimental results demonstrate that our model achieves a Track 1 score of 0.564 with a screening score of 0.696 on the test dataset on a single RTX 4090 GPU. The code is available at https://github.com/GZHU-DVL/Dikai.