Cross-polarization pairing for label-free few-shot thin-section classification

Bingchen Yan

Few-shot classifiers of rock thin sections are meta-trained on many rock types that a petrographer has identified slide by slide, and this identification is the costly step that new collections lack. We study few-shot recognition of unseen rock types when no training slide is identified, and the only information available is what the microscope records anyway: which slide an image comes from, and whether it was taken in plane-polarized (PPL) or cross-polarized (XPL) light. We first show why generic unsupervised pseudo-tasks fit this setting poorly: the positives they find without labels are either wrong or near-duplicates of the anchor, so they teach the model little. Polarized-light microscopy provides positives that avoid both problems. The PPL and XPL views of one field show the same grains, so they are correct by construction, yet they look very different. We propose cross-polarization pairing (XPP), which treats each slide as a pseudo-class and pairs its PPL and XPL views of the same field location, so that matching must rely on grain shape and texture rather than on colour. On the Nanjing University collection of 108 rock types, with support and query images taken from…