Embedding Predictive Adaptation and Refinement for Multi-Modal Industrial Anomaly Detection

Jaeho Cho, Jinsik Bang, Taehwan Kim

Industrial Anomaly Detection (IAD) has evolved from 2D image-based approaches to multi-modal methods that leverage the complementary nature of RGB images and 3D point clouds. Among these, memory bank-based methods, which identify anomalies by the discrepancy between each query patch feature and its nearest normal prototype, have proven particularly effective. However, two limitations remain: (i) employing frozen pretrained encoders yields insufficient discrimination between normal and anomalous features due to the domain gap, while existing contrastive learning-based adaptation struggles to capture the spatial relationships required for precise localization; and (ii) pixel-level anomaly maps interpolated from patch-level distance scores remain coarse, lacking fine-grained detail. To address these limitations, we propose EPAR (Embedding Predictive Adaptation and Refinement). We adapt encoders by predicting the embeddings of masked regions to capture spatial relationships, together with patch-level Variance-Invariance-Covariance (VIC) regularization, resolving the poor discriminability between normal and anomalous features caused by the domain gap. We further propose a Noise…